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Nanostructural Characterization of Amorphous Chalcogenides by X-Ray Diffraction and Positron Annihilation Techniques
Nanostructural Characterization of Amorphous Chalcogenides by X-Ray Diffraction and Positron Annihilation Techniques
Nanostructural Characterization of Amorphous Chalcogenides by X-Ray Diffraction and Positron Annihilation Techniques
Kavetskyy, T. (author) / Shpotyuk, O. (author) / Kaban, I. (author) / Hoyer, W. (author) / Filipecki, J. (author) / Reithmaier, J.P.
NATO Advanced Study Institute on Nanostructured Materials for Advanced Technological Applications ; 2008 ; Sozopol, Bulgaria
2009-01-01
6 pages
Includes bibliographical references and index
Conference paper
English
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