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    The measurement of internal defect in the half-grouted sleeves by low frequency ultrasonics

    New search for: Zhang, Lu
    New search for: Tang, Yongze
    New search for: Zeng, Jiajun
    New search for: Liu, Qizhou
    New search for: Li, Hongyu

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    The measurement of internal defect in the half-grouted sleeves by low frequency ultrasonics

    New search for: Zhang, Lu
    New search for: Tang, Yongze
    New search for: Zeng, Jiajun
    New search for: Liu, Qizhou
    New search for: Li, Hongyu

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The measurement of internal defect in the half-grouted sleeves by low frequency ultrasonics

    New search for: Zhang, Lu
    New search for: Tang, Yongze
    New search for: Zeng, Jiajun
    New search for: Liu, Qizhou
    New search for: Li, Hongyu

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    The measurement of internal defect in the half-grouted sleeves by low frequency ultrasonics

    Contributors:

    Zhang, Lu (author) / Tang, Yongze (author) / Zeng, Jiajun (author) / Liu, Qizhou (author) / Li, Hongyu (author)

    Conference:

    Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XVII

    Published in:

    Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XVII ; 124870A-124870A-9

    Proceedings of SPIE, the International Society for Optical Engineering ; 12487

    Publication date:

    2023-01-01

    Size:

    124870A-124870A-9

    ISBN:

    9781510660816

    ISSN:

    0277-786X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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