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    Chemical composition of porous silicon layers studied by IR spectroscopy

    New search for: Theiss, W.
    New search for: Grosse, P.
    New search for: Muender, H.
    New search for: Lueth, H.

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    Chemical composition of porous silicon layers studied by IR spectroscopy

    New search for: Theiss, W.
    New search for: Grosse, P.
    New search for: Muender, H.
    New search for: Lueth, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Chemical composition of porous silicon layers studied by IR spectroscopy

    New search for: Theiss, W.
    New search for: Grosse, P.
    New search for: Muender, H.
    New search for: Lueth, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Chemical composition of porous silicon layers studied by IR spectroscopy

    Contributors:

    Theiss, W. (author) / Grosse, P. (author) / Muender, H. (author) / Lueth, H. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 63 ; 240

    Publication date:

    1993-01-01

    Size:

    240 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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