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    Surface and Thin Film Analysis of Metals and Semiconductors Using X-Ray Photoelectron Spectroscopy

    New search for: Hofmann, S.

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    Surface and Thin Film Analysis of Metals and Semiconductors Using X-Ray Photoelectron Spectroscopy

    New search for: Hofmann, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Surface and Thin Film Analysis of Metals and Semiconductors Using X-Ray Photoelectron Spectroscopy

    New search for: Hofmann, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    Surface and Thin Film Analysis of Metals and Semiconductors Using X-Ray Photoelectron Spectroscopy

    Contributors:

    Hofmann, S. (author)

    Published in:

    ADVANCES IN X RAY ANALYSIS ; 883

    Publication date:

    1993-01-01

    Size:

    883 pages

    ISSN:

    0376-0308

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  539.7222

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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