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Powder X-Ray Diffraction Characterization of Laser Deposited Ferroelectric Thin Films

Wong-ng, W. / Huang, T. C. / Cook, L. P. / Schenck, P. K.

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Powder X-Ray Diffraction Characterization of Laser Deposited Ferroelectric Thin Films

Wong-ng, W. / Huang, T. C. / Cook, L. P. / Schenck, P. K.

Powder X-Ray Diffraction Characterization of Laser Deposited Ferroelectric Thin Films

Wong-ng, W. / Huang, T. C. / Cook, L. P. / Schenck, P. K.

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Check availability in my library

Order at Subito €

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Document information

Title:

Powder X-Ray Diffraction Characterization of Laser Deposited Ferroelectric Thin Films

Contributors:

Wong-ng, W. (author) / Huang, T. C. (author) / Cook, L. P. (author) / Schenck, P. K. (author)

Published in:

ADVANCES IN X RAY ANALYSIS ; 211

Publication date:

1993-01-01

Size:

211 pages

ISSN:

0376-0308

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 539.7222

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