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Investigation of the Influence of Impurities on the Grain Boundary Relaxation in Thin Al-Films on Si-Substrates
Investigation of the Influence of Impurities on the Grain Boundary Relaxation in Thin Al-Films on Si-Substrates
Investigation of the Influence of Impurities on the Grain Boundary Relaxation in Thin Al-Films on Si-Substrates
Bohn, H. G. (author) / Su, C. M. (author) / Magalas, L. B. / Gorczyca, S.
1993-01-01
273 pages
Article (Journal)
Unknown
DDC:
620.11
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