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Method of measurement and analysis of texture in thin films

Szpunar, J. A. / Ahlroos, S. / Tavernier, P.

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Method of measurement and analysis of texture in thin films

Szpunar, J. A. / Ahlroos, S. / Tavernier, P.

Method of measurement and analysis of texture in thin films

Szpunar, J. A. / Ahlroos, S. / Tavernier, P.

Access

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Method of measurement and analysis of texture in thin films

Contributors:

Szpunar, J. A. (author) / Ahlroos, S. (author) / Tavernier, P. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 28 ; 2366

Publication date:

1993-01-01

Size:

2366 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

Szpunar, J. A. / Blandford, P. | British Library Online Contents | 1994

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Detavernier, C. / Lavoie, C. | British Library Online Contents | 2005

Texture Development in Thin Films

Lee, D. N. | British Library Online Contents | 2002

Texture analysis of thin films on single crystalline substrates

Dittrich, H. / Flik, G. / Habermeter, H.-U. et al. | British Library Online Contents | 1993

Texture Studies on Borocarbide Thin Films

Rao, K. S. / Tamm, R. / Wimbush, S. C. et al. | British Library Online Contents | 2005