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    Characterisation of Ion Implanted Silicon and Diamond by Variable Wavelength Photoacoustic Microscopy and Scanning Acoustic Microscopy

    New search for: Nagata, Y.
    New search for: Yamanaka, K.
    New search for: Ogiso, H.
    New search for: Nakano, S.

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    Characterisation of Ion Implanted Silicon and Diamond by Variable Wavelength Photoacoustic Microscopy and Scanning Acoustic Microscopy

    New search for: Nagata, Y.
    New search for: Yamanaka, K.
    New search for: Ogiso, H.
    New search for: Nakano, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterisation of Ion Implanted Silicon and Diamond by Variable Wavelength Photoacoustic Microscopy and Scanning Acoustic Microscopy

    New search for: Nagata, Y.
    New search for: Yamanaka, K.
    New search for: Ogiso, H.
    New search for: Nakano, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Characterisation of Ion Implanted Silicon and Diamond by Variable Wavelength Photoacoustic Microscopy and Scanning Acoustic Microscopy

    Contributors:

    Nagata, Y. (author) / Yamanaka, K. (author) / Ogiso, H. (author) / Nakano, S. (author)

    Published in:

    NONDESTRUCTIVE TESTING AND EVALUATION ; 8/9 ; 1013

    Publication date:

    1993-01-01

    Size:

    1013 pages

    ISSN:

    1058-9759

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.1127

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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