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    Measurement of the Thermal Stress in Specularly Reflecting Thin Films Using Real-Time Holographic Interferometry

    New search for: Radha, T. S.
    New search for: Ramprasad, B. S.

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    Measurement of the Thermal Stress in Specularly Reflecting Thin Films Using Real-Time Holographic Interferometry

    New search for: Radha, T. S.
    New search for: Ramprasad, B. S.

    Access

    Access via TIB
    Check availability in my library
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    Measurement of the Thermal Stress in Specularly Reflecting Thin Films Using Real-Time Holographic Interferometry

    New search for: Radha, T. S.
    New search for: Ramprasad, B. S.

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    Measurement of the Thermal Stress in Specularly Reflecting Thin Films Using Real-Time Holographic Interferometry

    Contributors:

    Radha, T. S. (author) / Ramprasad, B. S. (author)

    Published in:

    NONDESTRUCTIVE TESTING AND EVALUATION ; 8/9 ; 949

    Publication date:

    1993-01-01

    Size:

    949 pages

    ISSN:

    1058-9759

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.1127

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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