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XPS and SIMS/SNMS measurements on thin metal oxide layers

Albers, T. / Neumann, M. / Lipinsky, D. / Benninghoven, A.

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XPS and SIMS/SNMS measurements on thin metal oxide layers

Albers, T. / Neumann, M. / Lipinsky, D. / Benninghoven, A.

XPS and SIMS/SNMS measurements on thin metal oxide layers

Albers, T. / Neumann, M. / Lipinsky, D. / Benninghoven, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

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Document information

Title:

XPS and SIMS/SNMS measurements on thin metal oxide layers

Contributors:

Albers, T. (author) / Neumann, M. (author) / Lipinsky, D. (author) / Benninghoven, A. (author)

Published in:

APPLIED SURFACE SCIENCE ; 70/71 ; 49

Publication date:

1993-01-01

Size:

49 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 621.35

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