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Comparative SIMS and SNMS analyses of amorphous semiconductor thin films

Gnaser, H. / Bock, W. / Oechsner, H. / Bhattacharayya, T. K.

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Comparative SIMS and SNMS analyses of amorphous semiconductor thin films

Gnaser, H. / Bock, W. / Oechsner, H. / Bhattacharayya, T. K.

Comparative SIMS and SNMS analyses of amorphous semiconductor thin films

Gnaser, H. / Bock, W. / Oechsner, H. / Bhattacharayya, T. K.

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Order at Subito €

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Document information

Title:

Comparative SIMS and SNMS analyses of amorphous semiconductor thin films

Contributors:

Gnaser, H. (author) / Bock, W. (author) / Oechsner, H. (author) / Bhattacharayya, T. K. (author)

Published in:

APPLIED SURFACE SCIENCE ; 70/71 ; 44

Publication date:

1993-01-01

Size:

44 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 621.35

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