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Microstructure and grain-boundary characterization of HIP'ed high-purity silicon nitride

Lu, P. / Danforth, S. C. / Symons, W. T.

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Microstructure and grain-boundary characterization of HIP'ed high-purity silicon nitride

Lu, P. / Danforth, S. C. / Symons, W. T.

Microstructure and grain-boundary characterization of HIP'ed high-purity silicon nitride

Lu, P. / Danforth, S. C. / Symons, W. T.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Microstructure and grain-boundary characterization of HIP'ed high-purity silicon nitride

Contributors:

Lu, P. (author) / Danforth, S. C. (author) / Symons, W. T. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 28 ; 4217

Publication date:

1993-01-01

Size:

4217 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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