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Crystalline characterization by Rutherford backscattering spectrometry and electron channelling of in-situ grown YBa~2Cu~3O~7 thin films deposited on (100) MgO by d.c. sputtering or laser ablation
Crystalline characterization by Rutherford backscattering spectrometry and electron channelling of in-situ grown YBa~2Cu~3O~7 thin films deposited on (100) MgO by d.c. sputtering or laser ablation
Crystalline characterization by Rutherford backscattering spectrometry and electron channelling of in-situ grown YBa~2Cu~3O~7 thin films deposited on (100) MgO by d.c. sputtering or laser ablation
Kechouane, M. (author) / L'Haridon, H. (author) / Salvi, M. (author) / Favennec, P. N. (author)
JOURNAL OF MATERIALS SCIENCE ; 28 ; 4934
1993-01-01
4934 pages
Article (Journal)
Unknown
DDC:
620.11
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