Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Crystalline characterization by Rutherford backscattering spectrometry and electron channelling of in-situ grown YBa~2Cu~3O~7 thin films deposited on (100) MgO by d.c. sputtering or laser ablation
Crystalline characterization by Rutherford backscattering spectrometry and electron channelling of in-situ grown YBa~2Cu~3O~7 thin films deposited on (100) MgO by d.c. sputtering or laser ablation
Crystalline characterization by Rutherford backscattering spectrometry and electron channelling of in-situ grown YBa~2Cu~3O~7 thin films deposited on (100) MgO by d.c. sputtering or laser ablation
Kechouane, M. (Autor:in) / L'Haridon, H. (Autor:in) / Salvi, M. (Autor:in) / Favennec, P. N. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 28 ; 4934
01.01.1993
4934 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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