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Electrical properties and degradation phenomena of glass-doped ZnO chip varistors

Lin, J. N. / Lin, C. M. / Kao, C. C. / Chang, W. C.

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Electrical properties and degradation phenomena of glass-doped ZnO chip varistors

Lin, J. N. / Lin, C. M. / Kao, C. C. / Chang, W. C.

Electrical properties and degradation phenomena of glass-doped ZnO chip varistors

Lin, J. N. / Lin, C. M. / Kao, C. C. / Chang, W. C.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Electrical properties and degradation phenomena of glass-doped ZnO chip varistors

Contributors:

Lin, J. N. (author) / Lin, C. M. (author) / Kao, C. C. (author) / Chang, W. C. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 20 ; 261

Publication date:

1993-01-01

Size:

261 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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