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    The Measurement of Triaxial Residual Stress in Polymer-Coated Aluminum Circuitry in Microchip Modules

    New search for: Crowder, C. E.
    New search for: Radler, M. J.
    New search for: Townsend, P.

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    The Measurement of Triaxial Residual Stress in Polymer-Coated Aluminum Circuitry in Microchip Modules

    New search for: Crowder, C. E.
    New search for: Radler, M. J.
    New search for: Townsend, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The Measurement of Triaxial Residual Stress in Polymer-Coated Aluminum Circuitry in Microchip Modules

    New search for: Crowder, C. E.
    New search for: Radler, M. J.
    New search for: Townsend, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    The Measurement of Triaxial Residual Stress in Polymer-Coated Aluminum Circuitry in Microchip Modules

    Contributors:

    Crowder, C. E. (author) / Radler, M. J. (author) / Townsend, P. (author)

    Published in:

    ADVANCES IN X RAY ANALYSIS ; 231

    Publication date:

    1993-01-01

    Size:

    231 pages

    ISSN:

    0376-0308

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  539.7222

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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