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Material Testing by Computer Aided Speckle Interferometry

Wang, Y. Y. / Chen, D. J. / Chiang, F. P.

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Material Testing by Computer Aided Speckle Interferometry

Wang, Y. Y. / Chen, D. J. / Chiang, F. P.

Material Testing by Computer Aided Speckle Interferometry

Wang, Y. Y. / Chen, D. J. / Chiang, F. P.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Material Testing by Computer Aided Speckle Interferometry

Contributors:

Wang, Y. Y. (author) / Chen, D. J. (author) / Chiang, F. P. (author)

Published in:

EXPERIMENTAL TECHNIQUES ; 17 ; 30

Publication date:

1993-01-01

Size:

30 pages

ISSN:

0732-8818

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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