Investigation of InGaAs/InP interdiffusion by simultaneous transmission electron microscopy and photoluminescence analysis: Fid-Bau Portal

Investigation of InGaAs/InP interdiffusion by simultaneous transmission electron microscopy and photoluminescence analysis

Osinowo, J. / Forchel, A. / Ganiere, J. D. / Ruterana, P.

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Investigation of InGaAs/InP interdiffusion by simultaneous transmission electron microscopy and photoluminescence analysis

Osinowo, J. / Forchel, A. / Ganiere, J. D. / Ruterana, P.

Investigation of InGaAs/InP interdiffusion by simultaneous transmission electron microscopy and photoluminescence analysis

Osinowo, J. / Forchel, A. / Ganiere, J. D. / Ruterana, P.

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Order at Subito €

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Document information

Title:

Investigation of InGaAs/InP interdiffusion by simultaneous transmission electron microscopy and photoluminescence analysis

Contributors:

Osinowo, J. (author) / Forchel, A. (author) / Ganiere, J. D. (author) / Ruterana, P. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 21 ; 277

Publication date:

1993-01-01

Size:

277 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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