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Hardness and Young's modulus of amorphous a-SiC thin films determined by nanoindentation and bulge tests
Hardness and Young's modulus of amorphous a-SiC thin films determined by nanoindentation and bulge tests
Hardness and Young's modulus of amorphous a-SiC thin films determined by nanoindentation and bulge tests
El Khakani, M. A. (author) / Chaker, M. (author) / Jean, A. (author) / Boily, S. (author)
1994-01-01
96 pages
Article (Journal)
Unknown
DDC:
620.11
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