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Hardness and Young's modulus of amorphous a-SiC thin films determined by nanoindentation and bulge tests
Hardness and Young's modulus of amorphous a-SiC thin films determined by nanoindentation and bulge tests
Hardness and Young's modulus of amorphous a-SiC thin films determined by nanoindentation and bulge tests
El Khakani, M. A. (Autor:in) / Chaker, M. (Autor:in) / Jean, A. (Autor:in) / Boily, S. (Autor:in)
01.01.1994
96 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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