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    Dissipation of contact-electrified charge on thin Si-oxide studied by atomic force microscopy

    New search for: Morita, S.
    New search for: Fukano, Y.
    New search for: Uchihashi, T.
    New search for: Sugawara, Y.

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    Dissipation of contact-electrified charge on thin Si-oxide studied by atomic force microscopy

    New search for: Morita, S.
    New search for: Fukano, Y.
    New search for: Uchihashi, T.
    New search for: Sugawara, Y.

    Access

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    Check availability in my library
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    Dissipation of contact-electrified charge on thin Si-oxide studied by atomic force microscopy

    New search for: Morita, S.
    New search for: Fukano, Y.
    New search for: Uchihashi, T.
    New search for: Sugawara, Y.

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    Dissipation of contact-electrified charge on thin Si-oxide studied by atomic force microscopy

    Contributors:

    Morita, S. (author) / Fukano, Y. (author) / Uchihashi, T. (author) / Sugawara, Y. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 75 ; 151

    Publication date:

    1994-01-01

    Size:

    151 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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