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    Contactless Photothermal Ionization Spectroscopy of Shallow Defects in Semiconductors

    New search for: Andreev, B. A.
    New search for: Ikonnikov, V. B.
    New search for: Koslov, E. B.
    New search for: Lifshits, T. M.

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    Contactless Photothermal Ionization Spectroscopy of Shallow Defects in Semiconductors

    New search for: Andreev, B. A.
    New search for: Ikonnikov, V. B.
    New search for: Koslov, E. B.
    New search for: Lifshits, T. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Contactless Photothermal Ionization Spectroscopy of Shallow Defects in Semiconductors

    New search for: Andreev, B. A.
    New search for: Ikonnikov, V. B.
    New search for: Koslov, E. B.
    New search for: Lifshits, T. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Contactless Photothermal Ionization Spectroscopy of Shallow Defects in Semiconductors

    Contributors:

    Andreev, B. A. (author) / Ikonnikov, V. B. (author) / Koslov, E. B. (author) / Lifshits, T. M. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 1365

    Publication date:

    1993-01-01

    Size:

    1365 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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