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Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy
Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy
Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy
Palumbo, O. (author) / Cantelli, R. (author) / Cordero, F. (author)
MATERIALS SCIENCE AND ENGINEERING A ; 370 ; 114-117
2004-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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