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Surface Investigations of Silylated Substrates by TOF-SIMS

Hagenhoff, B. / Benninghoven, A. / Stoppek-Langner, K. / Grobe, J.

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Surface Investigations of Silylated Substrates by TOF-SIMS

Hagenhoff, B. / Benninghoven, A. / Stoppek-Langner, K. / Grobe, J.

Surface Investigations of Silylated Substrates by TOF-SIMS

Hagenhoff, B. / Benninghoven, A. / Stoppek-Langner, K. / Grobe, J.

Access

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Surface Investigations of Silylated Substrates by TOF-SIMS

Contributors:

Hagenhoff, B. (author) / Benninghoven, A. (author) / Stoppek-Langner, K. (author) / Grobe, J. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH- ; 142

Publication date:

1994-01-01

Size:

142 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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