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    Application of Surface Fabrication to Strain Measurement in Nanometer Scale with the Scanning Tunneling Microscope

    New search for: Miyahara, K.
    New search for: Matsuoka, S.
    New search for: Nagashima, N.
    New search for: Masuda, H.

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    Application of Surface Fabrication to Strain Measurement in Nanometer Scale with the Scanning Tunneling Microscope

    New search for: Miyahara, K.
    New search for: Matsuoka, S.
    New search for: Nagashima, N.
    New search for: Masuda, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Application of Surface Fabrication to Strain Measurement in Nanometer Scale with the Scanning Tunneling Microscope

    New search for: Miyahara, K.
    New search for: Matsuoka, S.
    New search for: Nagashima, N.
    New search for: Masuda, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Application of Surface Fabrication to Strain Measurement in Nanometer Scale with the Scanning Tunneling Microscope

    Contributors:

    Miyahara, K. (author) / Matsuoka, S. (author) / Nagashima, N. (author) / Masuda, H. (author)

    Published in:

    JOURNAL OF TESTING AND EVALUATION ; 22 ; 121

    Publication date:

    1994-01-01

    Size:

    121 pages

    ISSN:

    0090-3973

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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