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Enhancing XRPD Pattern Quality with Line-Profile-Fitting in Multiphase Systems

Kimmel, G. / Sariel, J. / Dahan, I. / Nathan, S.

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Enhancing XRPD Pattern Quality with Line-Profile-Fitting in Multiphase Systems

Kimmel, G. / Sariel, J. / Dahan, I. / Nathan, S.

Enhancing XRPD Pattern Quality with Line-Profile-Fitting in Multiphase Systems

Kimmel, G. / Sariel, J. / Dahan, I. / Nathan, S.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Enhancing XRPD Pattern Quality with Line-Profile-Fitting in Multiphase Systems

Contributors:

Kimmel, G. (author) / Sariel, J. (author) / Dahan, I. (author) / Nathan, S. (author)

Published in:

ADVANCES IN X RAY ANALYSIS ; 95

Publication date:

1994-01-01

Size:

95 pages

ISSN:

0376-0308

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 539.7222

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