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Characterization of Crystalline Silicon via XRPD

Berti, G. / Bartoli, U. / Basile, G. / Becker, P. / Fitch, A.

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Characterization of Crystalline Silicon via XRPD

Berti, G. / Bartoli, U. / Basile, G. / Becker, P. / Fitch, A.

Characterization of Crystalline Silicon via XRPD

Berti, G. / Bartoli, U. / Basile, G. / Becker, P. / Fitch, A.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Characterization of Crystalline Silicon via XRPD

Contributors:

Berti, G. (author) / Bartoli, U. (author) / Basile, G. (author) / Becker, P. (author) / Fitch, A. (author)

Published in:

MATERIALS SCIENCE FORUM ; 443/444 ; 83-86

Publication date:

2004-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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