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    Analysis of IR absorption mapping of defects in liquid-encapsulated Czochralski GaAs

    New search for: Brozel, M. R.
    New search for: Tuzemen, S.
    New search for: Fornari, R.

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    Analysis of IR absorption mapping of defects in liquid-encapsulated Czochralski GaAs

    New search for: Brozel, M. R.
    New search for: Tuzemen, S.
    New search for: Fornari, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Analysis of IR absorption mapping of defects in liquid-encapsulated Czochralski GaAs

    New search for: Brozel, M. R.
    New search for: Tuzemen, S.
    New search for: Fornari, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Analysis of IR absorption mapping of defects in liquid-encapsulated Czochralski GaAs

    Contributors:

    Brozel, M. R. (author) / Tuzemen, S. (author) / Fornari, R.

    Published in:

    2nd International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies ; 130

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 28

    Publication date:

    1994-01-01

    Size:

    130 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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