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Identification of individual and aligned microdefects in bulk vertical Bridgman- and liquid encapsulated Czochralski-grown GaAs
Identification of individual and aligned microdefects in bulk vertical Bridgman- and liquid encapsulated Czochralski-grown GaAs
Identification of individual and aligned microdefects in bulk vertical Bridgman- and liquid encapsulated Czochralski-grown GaAs
Weyher, J. L. (author) / Schober, T. (author) / Sonnenberg, K. (author) / Franzosi, P. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 55 ; 79-85
1998-01-01
7 pages
Article (Journal)
English
DDC:
620.11
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