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    A comparison of X-ray photoelectron spectroscopy and Auger electron spectroscopy depth profiles for magnesium implants

    New search for: Schreifels, J. A.
    New search for: Turner, N. H.
    New search for: Morris, R. E.

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    A comparison of X-ray photoelectron spectroscopy and Auger electron spectroscopy depth profiles for magnesium implants

    New search for: Schreifels, J. A.
    New search for: Turner, N. H.
    New search for: Morris, R. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A comparison of X-ray photoelectron spectroscopy and Auger electron spectroscopy depth profiles for magnesium implants

    New search for: Schreifels, J. A.
    New search for: Turner, N. H.
    New search for: Morris, R. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    A comparison of X-ray photoelectron spectroscopy and Auger electron spectroscopy depth profiles for magnesium implants

    Contributors:

    Schreifels, J. A. (author) / Turner, N. H. (author) / Morris, R. E. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 84 ; 23

    Publication date:

    1995-01-01

    Size:

    23 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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