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A platform for research: civil engineering, architecture and urbanism
Defect profiling in elemental and multilayer systems: correlations of fitted defect concentrations with positron implantation profiles
Defect profiling in elemental and multilayer systems: correlations of fitted defect concentrations with positron implantation profiles
Defect profiling in elemental and multilayer systems: correlations of fitted defect concentrations with positron implantation profiles
Ghosh, V. J. (author) / Nielsen, B. (author) / Lynn, K. G. (author) / Welch, D. O. (author) / Doyama, M. / Akahane, T. / Fujinami, M.
1995-01-01
210 pages
Article (Journal)
Unknown
DDC:
621.35
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