Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Defect profiling in elemental and multilayer systems: correlations of fitted defect concentrations with positron implantation profiles
Defect profiling in elemental and multilayer systems: correlations of fitted defect concentrations with positron implantation profiles
Defect profiling in elemental and multilayer systems: correlations of fitted defect concentrations with positron implantation profiles
Ghosh, V. J. (Autor:in) / Nielsen, B. (Autor:in) / Lynn, K. G. (Autor:in) / Welch, D. O. (Autor:in) / Doyama, M. / Akahane, T. / Fujinami, M.
01.01.1995
210 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
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