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    Characterization of W/Si multilayers by ultrasoft x-ray emission spectroscopy

    New search for: Kurmaev, E. Z. et al.

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    Characterization of W/Si multilayers by ultrasoft x-ray emission spectroscopy

    New search for: Kurmaev, E. Z. et al.

    Access

    Access via TIB
    Check availability in my library
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    Characterization of W/Si multilayers by ultrasoft x-ray emission spectroscopy

    New search for: Kurmaev, E. Z. et al.

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    Characterization of W/Si multilayers by ultrasoft x-ray emission spectroscopy

    Contributors:

    Kurmaev, E. Z. et al. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 10 ; 907

    Publication date:

    1995-01-01

    Size:

    907 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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