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Thickness determination of uniform overlayers on rough substrates by angle-dependent XPS

Gunter, P. L. J. / Niemantsverdriet, J. W.

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Thickness determination of uniform overlayers on rough substrates by angle-dependent XPS

Gunter, P. L. J. / Niemantsverdriet, J. W.

Thickness determination of uniform overlayers on rough substrates by angle-dependent XPS

Gunter, P. L. J. / Niemantsverdriet, J. W.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Thickness determination of uniform overlayers on rough substrates by angle-dependent XPS

Contributors:

Gunter, P. L. J. (author) / Niemantsverdriet, J. W. (author)

Published in:

APPLIED SURFACE SCIENCE ; 89 ; 69

Publication date:

1995-01-01

Size:

69 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 621.35

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