Depth-dependent non-destructive analysis of thin overlayers using total-reflection-angle X-ray spectroscopy

Shibata, N. / Okubo, S. / Yonemitsu, K. | British Library Online Contents | 1996

Thickness determination of uniform overlayers on rough substrates by angle-dependent XPS

Gunter, P. L. J. / Niemantsverdriet, J. W. | British Library Online Contents | 1995

Infrared analysis of thin layers by attenuated total reflection spectroscopy

Rochat, N. / Chabli, A. / Bertin, F. et al. | British Library Online Contents | 2003

Dynamics of Mismatched Overlayers

Martini, K. M. / Burdick, S. / El-Batanouny, M. et al. | Springer Verlag | 1985

Determination of the topmost atomic layer of NdBa~2Cu~3O~y thin films by developed total reflection angle X-ray spectroscopy (TRAXS)

Liu, Z. / Badaye, M. / Ogota, S. et al. | British Library Online Contents | 1997