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    A new photoelastic procedure to determine SIF of mode I crack

    New search for: Chen, Z.

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    A new photoelastic procedure to determine SIF of mode I crack

    New search for: Chen, Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A new photoelastic procedure to determine SIF of mode I crack

    New search for: Chen, Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    A new photoelastic procedure to determine SIF of mode I crack

    Contributors:

    Chen, Z. (author)

    Published in:

    INTERNATIONAL JOURNAL OF FRACTURE ; 69 ; R89

    Publication date:

    1995-01-01

    Size:

    R89

    ISSN:

    0376-9429

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.1126

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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