HRTEM Study of Atomic Faceting Interfaces of �=3 NiSi~2/Si on (011)Si Substrate: Fid-Bau Portal

HRTEM Study of Atomic Faceting Interfaces of =3 NiSi~2/Si on (011)Si Substrate

Chen, W. J. / Chen, F.-R.

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HRTEM Study of Atomic Faceting Interfaces of =3 NiSi~2/Si on (011)Si Substrate

Chen, W. J. / Chen, F.-R.

HRTEM Study of Atomic Faceting Interfaces of =3 NiSi~2/Si on (011)Si Substrate

Chen, W. J. / Chen, F.-R.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

HRTEM Study of Atomic Faceting Interfaces of =3 NiSi~2/Si on (011)Si Substrate

Contributors:

Chen, W. J. (author) / Chen, F.-R. (author)

Published in:

MATERIALS SCIENCE FORUM ; 135

Publication date:

1995-01-01

Size:

135 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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