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Photoreflectance investigations of semiconductor device structures

Soares, J. A. N. T. / Beliaev, D. / Enderlein, R. / Scolfaro, L. M. R. / Saito, M. / Leite, J. R.

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Photoreflectance investigations of semiconductor device structures

Soares, J. A. N. T. / Beliaev, D. / Enderlein, R. / Scolfaro, L. M. R. / Saito, M. / Leite, J. R.

Photoreflectance investigations of semiconductor device structures

Soares, J. A. N. T. / Beliaev, D. / Enderlein, R. / Scolfaro, L. M. R. / Saito, M. / Leite, J. R.

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Document information

Title:

Photoreflectance investigations of semiconductor device structures

Contributors:

Soares, J. A. N. T. (author) / Beliaev, D. (author) / Enderlein, R. (author) / Scolfaro, L. M. R. (author) / Saito, M. (author) / Leite, J. R. (author) / Henini, M. / Szweda, R.

Published in:

Low Dimensional Structures and Devices ; 267-272

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 35

Publication date:

1995-01-01

Size:

6 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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