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Dopant Diffusion and Stacking Fault in Silicon During Thermal Oxidation
Dopant Diffusion and Stacking Fault in Silicon During Thermal Oxidation
Dopant Diffusion and Stacking Fault in Silicon During Thermal Oxidation
Okino, T. (author) / Takaue, R. (author) / Onishi, M. (author)
MATERIALS SCIENCE FORUM ; 1631-1636
1995-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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