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    Influence of Intrinsic Defects on the Electronic Structure of Non-Stoichiometric CuInS~2 Chalcopyrite Semiconductors

    New search for: Yamamoto, T.
    New search for: Katayama-Yoshida, H.

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    Influence of Intrinsic Defects on the Electronic Structure of Non-Stoichiometric CuInS~2 Chalcopyrite Semiconductors

    New search for: Yamamoto, T.
    New search for: Katayama-Yoshida, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Influence of Intrinsic Defects on the Electronic Structure of Non-Stoichiometric CuInS~2 Chalcopyrite Semiconductors

    New search for: Yamamoto, T.
    New search for: Katayama-Yoshida, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Influence of Intrinsic Defects on the Electronic Structure of Non-Stoichiometric CuInS~2 Chalcopyrite Semiconductors

    Contributors:

    Yamamoto, T. (author) / Katayama-Yoshida, H. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 1667-1672

    Publication date:

    1995-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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