A platform for research: civil engineering, architecture and urbanism
A Positron Lifetime Study of Lattice Defects in Chalcopyrite Semiconductors
A Positron Lifetime Study of Lattice Defects in Chalcopyrite Semiconductors
A Positron Lifetime Study of Lattice Defects in Chalcopyrite Semiconductors
Sherif Al-Kotb, M. (author) / Puff, W. (author) / Bischof, G. (author) / Davies, G. / Nazare, M. H.
1997-01-01
6 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
A Positron Lifetime Study of the Chalcopyrite Semiconductor CuInSe~2
British Library Online Contents | 1997
|EPR studies of point defects in Cu-III-VI2 chalcopyrite semiconductors
British Library Online Contents | 2003
|Positron Beam Studies of Defects in Semiconductors
British Library Online Contents | 2001
|A Positron Lifetime Study of Defects in Plastically Deformed Silicon
British Library Online Contents | 1995
|Positron States and Annihilation at Defects in Semiconductors
British Library Online Contents | 1997
|