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Defects in Porous Silicon: A Study With Optical and Spin Resonance Methodes
Defects in Porous Silicon: A Study With Optical and Spin Resonance Methodes
Defects in Porous Silicon: A Study With Optical and Spin Resonance Methodes
Hofmann, D. M. (author) / Meyer, B. K. (author) / Christmann, P. (author) / Wimbauer, T. (author) / Stadler, W. (author) / Nikolov, A. (author) / Scharmann, A. (author) / Hofstaetter, A. (author)
MATERIALS SCIENCE FORUM ; 1673-1678
1995-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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