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Arsenic-Antisite-Related Defects in GaAs Grown at Low Temperature: Characterization of Localized States
Arsenic-Antisite-Related Defects in GaAs Grown at Low Temperature: Characterization of Localized States
Arsenic-Antisite-Related Defects in GaAs Grown at Low Temperature: Characterization of Localized States
Landman, J. I. (author) / Morgan, C. G. (author) / Schick, J. T. (author) / Kumar, A. (author) / Papoulias, P. (author) / Kramer, M. F. (author)
MATERIALS SCIENCE FORUM ; 249-254
1995-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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