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    Thin Film Inspection with Millimeter-Wave Reflectometer

    New search for: Han, H. C.
    New search for: Mansueto, E. S.

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    Thin Film Inspection with Millimeter-Wave Reflectometer

    New search for: Han, H. C.
    New search for: Mansueto, E. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thin Film Inspection with Millimeter-Wave Reflectometer

    New search for: Han, H. C.
    New search for: Mansueto, E. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Thin Film Inspection with Millimeter-Wave Reflectometer

    Contributors:

    Han, H. C. (author) / Mansueto, E. S. (author)

    Published in:

    RESEARCH IN NONDESTRUCTIVE EVALUATION ; 7 ; 89-100

    Publication date:

    1995-01-01

    Size:

    12 pages

    ISSN:

    0934-9847

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1127

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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