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    Thin Layered Structures Analysis Using NUR Reflectometer

    New search for: Izerrouken, M.
    New search for: Gabouze, N.

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    Thin Layered Structures Analysis Using NUR Reflectometer

    New search for: Izerrouken, M.
    New search for: Gabouze, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thin Layered Structures Analysis Using NUR Reflectometer

    New search for: Izerrouken, M.
    New search for: Gabouze, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Thin Layered Structures Analysis Using NUR Reflectometer

    Contributors:

    Izerrouken, M. (author) / Gabouze, N.

    Published in:

    Thin Films and Porous Materials ; 53-58

    MATERIALS SCIENCE FORUM ; 609

    Publication date:

    2009-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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