Structural evolution and atomic structure of ultrahigh vacuum deposited Au thin films on silicon at low temperatures: Fid-Bau Portal

Structural evolution and atomic structure of ultrahigh vacuum deposited Au thin films on silicon at low temperatures

Chen, C. R. / Chen, L. J.

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Structural evolution and atomic structure of ultrahigh vacuum deposited Au thin films on silicon at low temperatures

Chen, C. R. / Chen, L. J.

Structural evolution and atomic structure of ultrahigh vacuum deposited Au thin films on silicon at low temperatures

Chen, C. R. / Chen, L. J.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Structural evolution and atomic structure of ultrahigh vacuum deposited Au thin films on silicon at low temperatures

Contributors:

Chen, C. R. (author) / Chen, L. J. (author)

Published in:

APPLIED SURFACE SCIENCE ; 92 ; 507-512

Publication date:

1996-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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