Calculation of the X-Ray Fluorescence Intensity for a Heterogeneous Powder Sample

Duimakaev, S. I. / Smolentseva, T. I. / Zagorodnii, V. V. et al. | British Library Online Contents | 1994

Synchrotron radiation excited total reflection X-ray fluorescence quantitative analysis of Si wafer by absolute fluorescence intensity calculation

Shin, N. S. / Chang, C. H. / Koo, Y. M. et al. | British Library Online Contents | 2001

Effect of Powder Sample Granularity on Fluorescent Intensity and on Thermal Parameters in X-Ray Diffraction Rietveld Analysis

Sparks, C. J. / Kumar, R. / Specht, E. D. et al. | British Library Online Contents | 1993

Analysis of the finite element calculation for stress intensity factor

Wu, Y. / Wang, Y. / Shi, Y. et al. | British Library Conference Proceedings | 2002

Experimental whole powder pattern intensity calibration in X-ray powder diffractometry (XRPD)

Kern, A. / Eysel, W. | British Library Online Contents | 1994