A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Synchrotron radiation excited total reflection X-ray fluorescence quantitative analysis of Si wafer by absolute fluorescence intensity calculation
Synchrotron radiation excited total reflection X-ray fluorescence quantitative analysis of Si wafer by absolute fluorescence intensity calculation
Synchrotron radiation excited total reflection X-ray fluorescence quantitative analysis of Si wafer by absolute fluorescence intensity calculation
Shin, N. S. (author) / Chang, C. H. (author) / Koo, Y. M. (author) / Padmore, H. (author)
MATERIALS LETTERS ; 49 ; 38-42
2001-01-01
5 pages
Article (Journal)
English
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