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    Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAP

    New search for: Al-Kassab, T.
    New search for: Macht, M.-P.
    New search for: Naundorf, V.
    New search for: Wollenberger, H.
    New search for: Chambreland, S.
    New search for: Danoix, F.
    New search for: Blavette, D.

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    Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAP

    New search for: Al-Kassab, T.
    New search for: Macht, M.-P.
    New search for: Naundorf, V.
    New search for: Wollenberger, H.
    New search for: Chambreland, S.
    New search for: Danoix, F.
    New search for: Blavette, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAP

    New search for: Al-Kassab, T.
    New search for: Macht, M.-P.
    New search for: Naundorf, V.
    New search for: Wollenberger, H.
    New search for: Chambreland, S.
    New search for: Danoix, F.
    New search for: Blavette, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAP

    Contributors:

    Al-Kassab, T. (author) / Macht, M.-P. (author) / Naundorf, V. (author) / Wollenberger, H. (author) / Chambreland, S. (author) / Danoix, F. (author) / Blavette, D. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 94/95 ; 306-312

    Publication date:

    1996-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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