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EPMA and XPS studies of the TiAl-SiC interfacial chemical compatibility

Silvain, J.-F. / Bihr, J.-C. / Lepetitcorps, Y.

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EPMA and XPS studies of the TiAl-SiC interfacial chemical compatibility

Silvain, J.-F. / Bihr, J.-C. / Lepetitcorps, Y.

EPMA and XPS studies of the TiAl-SiC interfacial chemical compatibility

Silvain, J.-F. / Bihr, J.-C. / Lepetitcorps, Y.

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Order at Subito €

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Document information

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Document information

Title:

EPMA and XPS studies of the TiAl-SiC interfacial chemical compatibility

Contributors:

Silvain, J.-F. (author) / Bihr, J.-C. (author) / Lepetitcorps, Y. (author)

Published in:

COMPOSITES PART A ; 27 ; 691-696

Publication date:

1996-01-01

Size:

6 pages

ISSN:

1359-835X

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.118

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